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authorSylwester Nawrocki <s.nawrocki@samsung.com>2016-09-01 13:59:00 +0200
committerLinus Walleij <linus.walleij@linaro.org>2016-09-12 15:45:16 +0200
commitb09eed7f811de64f1352634baa48ca8aecddac51 (patch)
tree066ecf813ec80b059bfbdbdd1252b8cffeb705a4 /Kbuild
parentpinctrl: intel: merrifield: fix dup size in probe (diff)
downloadlinux-b09eed7f811de64f1352634baa48ca8aecddac51.tar.xz
linux-b09eed7f811de64f1352634baa48ca8aecddac51.zip
pinctrl: samsung: Remove an always false dev->of_node test
samsung_pinctrl_probe() can be called only after matching the driver by the compatible string so this already implies a non null dev->of_node. Remove the always false test and related error trace. While at it drop another error log in case of memory allocation failure - any errors are logged by the memory subsystem. Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com> Reviewed-by: Krzysztof Kozlowski <k.kozlowski@samsung.com> Signed-off-by: Linus Walleij <linus.walleij@linaro.org>
Diffstat (limited to 'Kbuild')
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