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author | Sylwester Nawrocki <s.nawrocki@samsung.com> | 2016-09-01 13:59:00 +0200 |
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committer | Linus Walleij <linus.walleij@linaro.org> | 2016-09-12 15:45:16 +0200 |
commit | b09eed7f811de64f1352634baa48ca8aecddac51 (patch) | |
tree | 066ecf813ec80b059bfbdbdd1252b8cffeb705a4 /Kbuild | |
parent | pinctrl: intel: merrifield: fix dup size in probe (diff) | |
download | linux-b09eed7f811de64f1352634baa48ca8aecddac51.tar.xz linux-b09eed7f811de64f1352634baa48ca8aecddac51.zip |
pinctrl: samsung: Remove an always false dev->of_node test
samsung_pinctrl_probe() can be called only after matching
the driver by the compatible string so this already implies
a non null dev->of_node. Remove the always false test
and related error trace. While at it drop another error log
in case of memory allocation failure - any errors are logged
by the memory subsystem.
Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com>
Reviewed-by: Krzysztof Kozlowski <k.kozlowski@samsung.com>
Signed-off-by: Linus Walleij <linus.walleij@linaro.org>
Diffstat (limited to 'Kbuild')
0 files changed, 0 insertions, 0 deletions