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| author | Vignesh R <vigneshr@ti.com> | 2018-12-03 09:01:18 +0100 |
|---|---|---|
| committer | Lee Jones <lee.jones@linaro.org> | 2018-12-03 12:33:20 +0100 |
| commit | 4b3ab9372ffa569827c8f7b7ffc7b69ba544a3bd (patch) | |
| tree | 25e4d43f90834fc71dd5aadf768b4b654c001a16 /arch | |
| parent | mfd: ti_am335x_tscadc: Use PLATFORM_DEVID_AUTO while registering mfd cells (diff) | |
| download | linux-4b3ab9372ffa569827c8f7b7ffc7b69ba544a3bd.tar.xz linux-4b3ab9372ffa569827c8f7b7ffc7b69ba544a3bd.zip | |
iio: adc: ti_am335x_tscadc: Improve accuracy of measurement
When performing single ended measurements with TSCADC, its recommended
to set negative input (SEL_INM_SWC_3_0) of ADC step to ADC's VREFN in the
corresponding STEP_CONFIGx register.
Also, the positive(SEL_RFP_SWC_2_0) and negative(SEL_RFM_SWC_1_0)
reference voltage for ADC step needs to be set to VREFP and VREFN
respectively in STEP_CONFIGx register.
Without these changes, there may be variation of as much as ~2% in the
ADC's digital output which is bad for precise measurement.
Signed-off-by: Vignesh R <vigneshr@ti.com>
Acked-by: Jonathan Cameron <Jonathan.Cameron@huawei.com>
Signed-off-by: Lee Jones <lee.jones@linaro.org>
Diffstat (limited to 'arch')
0 files changed, 0 insertions, 0 deletions