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Diffstat (limited to 'Documentation/ABI/testing/sysfs-bus-iio')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 12 |
1 files changed, 12 insertions, 0 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 866b4ec4aab6..e46c71fbd047 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -1375,3 +1375,15 @@ Description: The emissivity ratio of the surface in the field of view of the contactless temperature sensor. Emissivity varies from 0 to 1, with 1 being the emissivity of a black body. + +What: /sys/bus/iio/devices/iio:deviceX/in_magn_x_oversampling_ratio +What: /sys/bus/iio/devices/iio:deviceX/in_magn_y_oversampling_ratio +What: /sys/bus/iio/devices/iio:deviceX/in_magn_z_oversampling_ratio +KernelVersion: 4.2 +Contact: linux-iio@vger.kernel.org +Description: + Hardware applied number of measurements for acquiring one + data point. The HW will do <type>[_name]_oversampling_ratio + measurements and return the average value as output data. Each + value resulted from <type>[_name]_oversampling_ratio measurements + is considered as one sample for <type>[_name]_sampling_frequency. |