diff options
Diffstat (limited to 'Documentation/ABI')
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio | 7 | ||||
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio-cros-ec | 10 | ||||
| -rw-r--r-- | Documentation/ABI/testing/sysfs-bus-iio-frequency-adf4371 | 44 |
3 files changed, 54 insertions, 7 deletions
diff --git a/Documentation/ABI/testing/sysfs-bus-iio b/Documentation/ABI/testing/sysfs-bus-iio index 6aef7dbbde44..680451695422 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio +++ b/Documentation/ABI/testing/sysfs-bus-iio @@ -61,8 +61,11 @@ What: /sys/bus/iio/devices/triggerX/sampling_frequency_available KernelVersion: 2.6.35 Contact: linux-iio@vger.kernel.org Description: - When the internal sampling clock can only take a small - discrete set of values, this file lists those available. + When the internal sampling clock can only take a specific set of + frequencies, we can specify the available values with: + - a small discrete set of values like "0 2 4 6 8" + - a range with minimum, step and maximum frequencies like + "[min step max]" What: /sys/bus/iio/devices/iio:deviceX/oversampling_ratio KernelVersion: 2.6.38 diff --git a/Documentation/ABI/testing/sysfs-bus-iio-cros-ec b/Documentation/ABI/testing/sysfs-bus-iio-cros-ec index 0e95c2ca105c..6158f831c761 100644 --- a/Documentation/ABI/testing/sysfs-bus-iio-cros-ec +++ b/Documentation/ABI/testing/sysfs-bus-iio-cros-ec @@ -18,11 +18,11 @@ Description: values are 'base' and 'lid'. What: /sys/bus/iio/devices/iio:deviceX/id -Date: Septembre 2017 +Date: September 2017 KernelVersion: 4.14 Contact: linux-iio@vger.kernel.org Description: - This attribute is exposed by the CrOS EC legacy accelerometer - driver and represents the sensor ID as exposed by the EC. This - ID is used by the Android sensor service hardware abstraction - layer (sensor HAL) through the Android container on ChromeOS. + This attribute is exposed by the CrOS EC sensors driver and + represents the sensor ID as exposed by the EC. This ID is used + by the Android sensor service hardware abstraction layer (sensor + HAL) through the Android container on ChromeOS. diff --git a/Documentation/ABI/testing/sysfs-bus-iio-frequency-adf4371 b/Documentation/ABI/testing/sysfs-bus-iio-frequency-adf4371 new file mode 100644 index 000000000000..302de64cb424 --- /dev/null +++ b/Documentation/ABI/testing/sysfs-bus-iio-frequency-adf4371 @@ -0,0 +1,44 @@ +What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_frequency +KernelVersion: +Contact: linux-iio@vger.kernel.org +Description: + Stores the PLL frequency in Hz for channel Y. + Reading returns the actual frequency in Hz. + The ADF4371 has an integrated VCO with fundamendal output + frequency ranging from 4000000000 Hz 8000000000 Hz. + + out_altvoltage0_frequency: + A divide by 1, 2, 4, 8, 16, 32 or circuit generates + frequencies from 62500000 Hz to 8000000000 Hz. + out_altvoltage1_frequency: + This channel duplicates the channel 0 frequency + out_altvoltage2_frequency: + A frequency doubler generates frequencies from + 8000000000 Hz to 16000000000 Hz. + out_altvoltage3_frequency: + A frequency quadrupler generates frequencies from + 16000000000 Hz to 32000000000 Hz. + + Note: writes to one of the channels will affect the frequency of + all the other channels, since it involves changing the VCO + fundamental output frequency. + +What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_name +KernelVersion: +Contact: linux-iio@vger.kernel.org +Description: + Reading returns the datasheet name for channel Y: + + out_altvoltage0_name: RF8x + out_altvoltage1_name: RFAUX8x + out_altvoltage2_name: RF16x + out_altvoltage3_name: RF32x + +What: /sys/bus/iio/devices/iio:deviceX/out_altvoltageY_powerdown +KernelVersion: +Contact: linux-iio@vger.kernel.org +Description: + This attribute allows the user to power down the PLL and it's + RFOut buffers. + Writing 1 causes the specified channel to power down. + Clearing returns to normal operation. |