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path: root/Documentation/usb/gadget-testing.txt (follow)
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* usb: gadget: printer: add configfs supportAndrzej Pietrasiewicz2015-03-101-0/+47
| | | | | | | | Add support for configfs interface so that f_printer can be used as a component of usb gadgets composed with it. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UVC function testingAndrzej Pietrasiewicz2015-01-121-0/+73
| | | | | | | Summary of how to test UVC function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UAC2 function testingAndrzej Pietrasiewicz2015-01-121-0/+39
| | | | | | | Summary of how to test UAC2 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UAC1 function testingAndrzej Pietrasiewicz2015-01-121-0/+27
| | | | | | | Summary of how to test UAC1 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: SOURCESINK function testingAndrzej Pietrasiewicz2015-01-121-0/+27
| | | | | | | Summary of how to test SOURCESINK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: SERIAL function testingAndrzej Pietrasiewicz2015-01-121-0/+31
| | | | | | | Summary of how to test SERIAL function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: RNDIS function testingAndrzej Pietrasiewicz2015-01-121-0/+36
| | | | | | | Summary of how to test RNDIS function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: PHONET function testingAndrzej Pietrasiewicz2015-01-121-0/+64
| | | | | | | Summary of how to test PHONET function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: OBEX function testingAndrzej Pietrasiewicz2015-01-121-0/+29
| | | | | | | Summary of how to test OBEX function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: NCM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test NCM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: MIDI function testingAndrzej Pietrasiewicz2015-01-121-0/+84
| | | | | | | Summary of how to test MIDI function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: MASS STORAGE function testingAndrzej Pietrasiewicz2015-01-121-0/+54
| | | | | | | Summary of how to test MASS STORAGE function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: LOOPBACK function testingAndrzej Pietrasiewicz2015-01-121-0/+23
| | | | | | | Summary of how to test LOOPBACK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: HID function testingAndrzej Pietrasiewicz2015-01-121-0/+47
| | | | | | | Summary of how to test HID function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: FFS function testingAndrzej Pietrasiewicz2015-01-121-0/+24
| | | | | | | Summary of how to test FFS (FunctionFS) function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: EEM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test EEM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ECM subset function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test ECM subset function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ECM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test ECM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ACM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
The newly added file will be used to provide descriptions of how to test the functions of USB gadgets. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>