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path: root/Documentation/usb/gadget-testing.txt (follow)
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* Documentation: usb: update usb-tools repository addressRobert Baldyga2015-12-161-1/+1
| | | | | | | | It seems that gitorious repository is no longer accessible, so we replace it with address to active repository. Signed-off-by: Robert Baldyga <r.baldyga@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: gadget-testing: add description for depth of queuePeter Chen2015-12-151-0/+2
| | | | | | | | Add both bulk and iso depth of queue for sourcesink. Reviewed-by: Krzysztof Opasiak <k.opasiak@samsung.com> Signed-off-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* doc: usb: gadget-testing: using the updated testusb.cPeter Chen2015-07-311-5/+2
| | | | | | | | | testusb.c at http://www.linux-usb.org/usbtest/ is out of date, using the one at the kernel source folder. Cc: <stable@vger.kernel.org> Signed-off-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* usb: gadget: rndis: remove the limit of available rndis connectionsAndrzej Pietrasiewicz2015-05-071-2/+0
| | | | | | | | | | | | | | | | | | | RNDIS function has a limitation on the number of allowed instances. So far it has been RNDIS_MAX_CONFIGS, which happens to be one. In order to eliminate this kind of arbitrary limitation we should not preallocate a predefined (RNDIS_MAX_CONFIGS) array of struct rndis_params instances but instead allow allocating them on demand. This patch allocates struct rndis_params on demand in rndis_register(). Coversly, the structure is free()'d in rndis_deregister(). If CONFIG_USB_GADGET_DEBUG_FILES is set, the proc files are created which is the same behaviour as before, but the moment of creation is delayed until struct rndis_params is actually allocated. rnids_init() and rndis_exit() have nothing to do, so they are eliminated. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* usb: Documentation: gadget-testing: fix parameter for capture channel maskPeter Chen2015-04-271-1/+1
| | | | | | | Fix the UAC2 parameter capture channel mask Signed-off-by: Peter Chen <peter.chen@freescale.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* usb: gadget: printer: add configfs supportAndrzej Pietrasiewicz2015-03-101-0/+47
| | | | | | | | Add support for configfs interface so that f_printer can be used as a component of usb gadgets composed with it. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UVC function testingAndrzej Pietrasiewicz2015-01-121-0/+73
| | | | | | | Summary of how to test UVC function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UAC2 function testingAndrzej Pietrasiewicz2015-01-121-0/+39
| | | | | | | Summary of how to test UAC2 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: UAC1 function testingAndrzej Pietrasiewicz2015-01-121-0/+27
| | | | | | | Summary of how to test UAC1 function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: SOURCESINK function testingAndrzej Pietrasiewicz2015-01-121-0/+27
| | | | | | | Summary of how to test SOURCESINK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: SERIAL function testingAndrzej Pietrasiewicz2015-01-121-0/+31
| | | | | | | Summary of how to test SERIAL function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: RNDIS function testingAndrzej Pietrasiewicz2015-01-121-0/+36
| | | | | | | Summary of how to test RNDIS function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: PHONET function testingAndrzej Pietrasiewicz2015-01-121-0/+64
| | | | | | | Summary of how to test PHONET function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: OBEX function testingAndrzej Pietrasiewicz2015-01-121-0/+29
| | | | | | | Summary of how to test OBEX function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: NCM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test NCM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: MIDI function testingAndrzej Pietrasiewicz2015-01-121-0/+84
| | | | | | | Summary of how to test MIDI function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: MASS STORAGE function testingAndrzej Pietrasiewicz2015-01-121-0/+54
| | | | | | | Summary of how to test MASS STORAGE function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: LOOPBACK function testingAndrzej Pietrasiewicz2015-01-121-0/+23
| | | | | | | Summary of how to test LOOPBACK function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: HID function testingAndrzej Pietrasiewicz2015-01-121-0/+47
| | | | | | | Summary of how to test HID function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: FFS function testingAndrzej Pietrasiewicz2015-01-121-0/+24
| | | | | | | Summary of how to test FFS (FunctionFS) function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: EEM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test EEM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ECM subset function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test ECM subset function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ECM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
| | | | | | | Summary of how to test ECM function of USB gadget. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
* Documentation: usb: ACM function testingAndrzej Pietrasiewicz2015-01-121-0/+34
The newly added file will be used to provide descriptions of how to test the functions of USB gadgets. Signed-off-by: Andrzej Pietrasiewicz <andrzej.p@samsung.com> Signed-off-by: Felipe Balbi <balbi@ti.com>
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